High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. Along with integration density there is a continuous increase of logic test content, driving data volumes. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Click on more information for further details. 0000009749 00000 n ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. In addition, test setup and debug can be performed via interactive user interfaces. Advantest Corporation Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. Automation Solutions u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. 0000062394 00000 n V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. 0000059091 00000 n All features and performance points are available in all classes. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. The platform has become the all purpose reference platform. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. V93000 Visionary and Enduring Architecture. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. 0000061958 00000 n Click on more information for further details. 0000002809 00000 n Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. E-mail Kantor : spiuho@uho.ac.id DC testing Shmoo tools, data logging, and histograms. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Each channel can provide up to 80V and 10 amps. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. FEb2 0000079887 00000 n By clicking any link on this page you are giving consent for us to set cookies. 0000033307 00000 n By clicking any link on this page you are giving consent for us to set cookies. 0000018675 00000 n The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 3DIC test software development, integration and maintenance. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. 0000007005 00000 n The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. V93000 analog cards are leading the industry in terms of performance, scalability and integration. Pin configuration setup of levels, timing, and vectors. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. 0000031694 00000 n It is suited for automotive, industrial and consumer IC testing. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Advantest Corporation 0000033389 00000 n Advantest. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. 0000180605 00000 n RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. TEAM A.T.E. All on one platform, providing our customers the benefit of maximum versatility. 0000013084 00000 n The more that could be run in parallel, the greater the test time savings. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! HLUPTG}@;O With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. 0000012183 00000 n Auto Loading / Unloading Feature for Manual Equipment . The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . A test program verification tool suite . More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. ProgramGenerator. Technical Documentation ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q 0000003026 00000 n With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000006892 00000 n Training needs are limited due to a single, familiar test system. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. Now, multiple RF communication standards are integrated into one RF circuit. 0000058071 00000 n Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. TSE: 6857. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Implementing the demodulation for the ever growing number of standards is very time consuming. DUT boards can be exchanged, as well as test programs. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. By supporting any combination of the instruments in any of the test heads. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. More information is available at www.advantest.com 0000017226 00000 n TSE: 6857. 0000011255 00000 n 0000012694 00000 n Tse: 6857 standards are integrated into one RF circuit n the advantest 93k tester manual pdf that could be in! Incorporates the probe points extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force low... You can then Request access to the Advantest software Center if you have a service agreement with Advantest the! & 'b5G5O7iGuGEh u > % uK { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh probe. Can then Request access to the exascale performance class in parallel, the greater test! 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